Publications

@inproceedings{rech2010analysis,

title = {Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts},

author = {Paolo Rech and Michelangelo Grosso and Fabio Melchiori and Domenico Loparco and Davide Appello and Luigi Dilillo and Alessandro Paccagnella and M Sonza Reorda},

year  = {2010},

date = {2010-01-01},

booktitle = {2010 IEEE 16th International On-Line Testing Symposium},

pages = {29--34},

organization = {IEEE},

keywords = {},

pubstate = {published},

tppubtype = {inproceedings}

}

@inproceedings{rech2010impact,

title = {Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors},

author = {Paolo Rech and Jean-Marc Galliere and Patrick Girard and Frédéric Wrobel and Frédéric Saigné and Luigi Dilillo},

year  = {2010},

date = {2010-01-01},

booktitle = {RADECS: European Conference on Radiation and Its Effects on Components and Systems},

volume = {11},

organization = {IEEE},

keywords = {},

pubstate = {published},

tppubtype = {inproceedings}

}

@inproceedings{gervasi2010aes,

title = {The AES implantation based on OpenCL for multi/many core architecture},

author = {Osvaldo Gervasi and Diego Russo and Flavio Vella},

year  = {2010},

date = {2010-01-01},

booktitle = {2010 International Conference on Computational Science and Its Applications},

pages = {129--134},

organization = {IEEE},

keywords = {},

pubstate = {published},

tppubtype = {inproceedings}

}

@inproceedings{appello2009dft,

title = {Dft reuse for low-cost radiation testing of socs: A case study},

author = {Davide Appello and Paolo Bernardi and Simone Gerardin and Michelangelo Grosso and Alessandro Paccagnella and Paolo Rech and M Sonza Reorda},

year  = {2009},

date = {2009-01-01},

booktitle = {2009 27th IEEE VLSI Test Symposium},

pages = {276--281},

organization = {IEEE},

keywords = {},

pubstate = {published},

tppubtype = {inproceedings}

}

@inproceedings{rech2009evaluating,

title = {Evaluating alpha-induced soft errors in embedded microprocessors},

author = {Paolo Rech and Simone Gerardin and Alessandro Paccagnella and Paolo Bernardi and Michelangelo Grosso and M Sonza Reorda and Davide Appello},

year  = {2009},

date = {2009-01-01},

booktitle = {2009 15th IEEE International On-Line Testing Symposium},

pages = {69--74},

organization = {IEEE},

keywords = {},

pubstate = {published},

tppubtype = {inproceedings}

}

@inproceedings{manuzzato2007sensitivity,

title = {Sensitivity evaluation of TMR-hardened circuits to multiple SEUs induced by alpha particles in commercial SRAM-based FPGAs},

author = {Andrea Manuzzato and Paolo Rech and Simone Gerardin and Alessandro Paccagnella and Luca Sterpone and Massimo Violante},

year  = {2007},

date = {2007-01-01},

booktitle = {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)},

pages = {79--86},

organization = {IEEE},

keywords = {},

pubstate = {published},

tppubtype = {inproceedings}

}