The paper “Soft Error Effects on Arm Microprocessors: Early Estimations versus Chip Measurements” is the Best Paper of IEEE Transactions on Computers! An outstanding work from our research group.
In the paper, resulting from a collaboration between the University of Trento in Italy, UFRGS in Brazil, and the University of Athens in Greece, we have shown how it is possible, from the mere abstract description of the architecture, to predict the reliability of ARM embedded processors.
To achieve an accurate evaluation, we have performed both fault injection on simulators and radiation experiments using accelerated particle beams. The impact of the work relies on the possibility to estimate the behaviors of the processor before printing it in silicon.
Go check it out now on IEEE Xplore!
